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Contact Resistance as an Origin of the Channel-Length-Dependent Threshold Voltage in Organic Field-Effect Transistors

✍ Scribed by Weis, Martin; Lee, Keanchuan; Taguchi, Dai; Manaka, Takaaki; Iwamoto, Mitsumasa

Book ID: 120347403
Publisher: Institute of Pure and Applied Physics
Year: 2012
Tongue: English
Weight: 385 KB
Volume: 51
Category: Article
ISSN: 0021-4922
DOI: 10.1143/JJAP.51.100205

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