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Charge Trapping by Self-Assembled Monolayers as the Origin of the Threshold Voltage Shift in Organic Field-Effect Transistors

✍ Scribed by Fatemeh Gholamrezaie; Anne-Marije Andringa; W. S. Christian Roelofs; Alfred Neuhold; Martijn Kemerink; Paul W. M. Blom; Dago M. de Leeuw


Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
629 KB
Volume
8
Category
Article
ISSN
1613-6810

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