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Consistent model for the voltage and temperature dependence of the soft breakdown conduction mechanism in ultrathin gate oxides

✍ Scribed by A Avellán; E Miranda; D Schroeder; W Krautschneider


Book ID
108207318
Publisher
Elsevier Science
Year
2004
Tongue
English
Weight
302 KB
Volume
72
Category
Article
ISSN
0167-9317

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