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Consistent model for short-channel nMOSFET after hard gate oxide breakdown

✍ Scribed by Kaczer, B.; Degraeve, R.; De Keersgieter, A.; Van de Mieroop, K.; Simons, V.; Groeseneken, G.

Book ID: 114539028
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 197 KB
Volume: 49
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.987123

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