๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Concurrent error detection in nonlinear digital circuits using time-freeze linearization

โœ Scribed by Chatterjee, A.; Roy, R.K.


Book ID
119772773
Publisher
IEEE
Year
1997
Tongue
English
Weight
375 KB
Volume
46
Category
Article
ISSN
0018-9340

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


On concurrent multiple error diagnosabil
โœ Zhou, Yingquan; Wong, Mike W. T.; Min, Yinghua ๐Ÿ“‚ Article ๐Ÿ“… 1998 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 140 KB

Although most of the work done in fault tolerance is in the digital field, it is widely understood that error detection and correction capability in analog circuits has the same importance as in digital circuits. The technique proposed by Abhijit Chatterjee can realize concurrent single error detect