On concurrent multiple error diagnosability in linear analog circuits using continuous checksum

✍ Scribed by Zhou, Yingquan; Wong, Mike W. T.; Min, Yinghua

• Publisher: John Wiley and Sons
• Year: 1998
• Tongue: English
• Weight: 140 KB
• Volume: 26
• Category: Article
• ISSN: 0098-9886
• DOI: 10.1002/(sici)1097-007x(199801/02)26:1<53::aid-cta990>3.0.co;2-v

✦ Synopsis

Although most of the work done in fault tolerance is in the digital field, it is widely understood that error detection and correction capability in analog circuits has the same importance as in digital circuits. The technique proposed by Abhijit Chatterjee can realize concurrent single error detection and correction in linear analog circuits well. Based on his work, this paper addresses concurrent multiple error detection and correction in linear analog systems, which is known to be a difficult and unsolved problem. We prove that the concurrent error diagnosis scheme using continuous checksum can not be extended to the case of multiple errors under the assumption that the checker and the functional block will not fail simultaneously, though people are still attempting to make such an extension.