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Concentration profiles of implanted boron ions in silicon from measurements with the ion microprobe

✍ Scribed by Schwarz, G. ;Trapp, M. ;Schimko, R. ;Butzke, G. ;Rogge, K.


Publisher
John Wiley and Sons
Year
1973
Tongue
English
Weight
364 KB
Volume
17
Category
Article
ISSN
0031-8965

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