High concentration effects of ion implanted boron in silicon
✍ Scribed by H. Ryssel; K. Müller; K. Haberger; R. Henkelmann; F. Jahnel
- Publisher
- Springer
- Year
- 1980
- Tongue
- English
- Weight
- 322 KB
- Volume
- 22
- Category
- Article
- ISSN
- 1432-0630
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Boron ion implantation into pre-amorphized silicon is studied. Pre-amorphization is performed either by F + or Si + implantation prior to B + implantation at 10 keV with 3 Â 10 15 ions/cm 2 . Broadening of the boron profile can be suppressed markedly in the pre-amorphized layers. For instance, the a
## Abstract The presence of boron in silicon has been shown to have a deleterious effect on the luminescence of interstitial‐related centres, particularly the W‐centre which is often observed after ion implantation and a low temperature anneal. Competition between silicon‐interstitial and boron‐int