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Computing optimal test sequences from complete test sets for stuck-open faults in CMOS circuits

✍ Scribed by Chakravarty, S.; Ravi, S.S.

Book ID: 119778020
Publisher: IEEE
Year: 1990
Tongue: English
Weight: 354 KB
Volume: 9
Category: Article
ISSN: 0278-0070
DOI: 10.1109/43.46808

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