Computer-communication network reliability: trends and issues: Inder M. Soi and K. K. Aggarwal. Microelectron. Reliab. 21 (1) 79 (1981)

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 117 KB
• Volume: 22
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(82)90119-6