Empirical prediction of overall reliability in computer communication networks : Sanjaya Srivastava and Inder M. Soi. Microelectron. Reliab.23 (1), 137 (1983)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 129 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)90829-6