Designing reliable communication networks in a planned failure environment : Inder M. Soi and K. K. Aggarwal. Microelectron. Reliab.22 (3), 363 (1982)

• Publisher: Elsevier Science
• Year: 1983
• Tongue: English
• Weight: 121 KB
• Volume: 23
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(83)91082-x