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Computer-aided testing: a new solution for self-calibration

✍ Scribed by U.E. Wiener; I.F. Cretu


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
556 KB
Volume
1
Category
Article
ISSN
0263-2241

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## Abstract It is common to use ATPG of scan‐based design for high fault coverage in LSI testing. However, significant increases in test cost arise with increasing design complexity. Recent strategies for test cost reduction combine ATPG and BIST techniques. Unfortunately, these strategies have ser