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On a new method for testing and calibrating wire chambers

✍ Scribed by H. Anderhub; M. Devereux; P.G. Seiler


Publisher
Elsevier Science
Year
1980
Weight
91 KB
Volume
176
Category
Article
ISSN
0029-554X

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## Abstract Based on the conventional through‐short‐match (TSM) method, an improved TSM method has been proposed in this Letter. This method gives an analytical solution and has almost all the advantages of conventional TSM methods. For example, it has no phase uncertainty and no bandwidth limitati