Computer-Aided Test Generation for Four-Phase MOS LSI Circuits

[IEEE Comput. Soc. Press 1993 Internatio

[IEEE Comput. Soc. Press 1993 International Conference on Computer Aided Design (ICCAD) - Santa Clara, CA, USA (7-11 Nov. 1993)] Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) - On-chip test generation for combinational circuits by LFSR modification

✍ Upadhyaya, S.J.; Chen, L.-C. 📂 Article 📅 1993 🏛 IEEE Comput. Soc. Press ⚖ 464 KB

[IEEE Comput. Soc. Press 1993 Internatio

[IEEE Comput. Soc. Press 1993 International Conference on Computer Aided Design (ICCAD) - Santa Clara, CA, USA (7-11 Nov. 1993)] Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) - On-chip test generation for combinational circuits by LFSR modification

✍ Upadhyaya, S.J.; Chen, L.-C. 📂 Article 📅 1993 🏛 IEEE Comput. Soc. Press ⚖ 464 KB

A new on-chip test generation technique based on the built-in self test (BIST) and deterministic test generation concepts has been proposed. Given a test set, the test patterns can be regenerated on the chip and applied to the circuit under test without the use of any external test equipments.A syst

[IEEE Comput. Soc. Press [1989] 1st Euro

[IEEE Comput. Soc. Press [1989] 1st European Test Conference - Paris, France (12-14 April 1989)] [1989] Proceedings of the 1st European Test Conference - Mixed level test generation for MOS circuits

✍ Lioy, A. 📂 Article 📅 1989 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 353 KB

[IEEE Comput. Soc. Press 1991 IEEE Inter

[IEEE Comput. Soc. Press 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers - Santa Clara, CA, USA (11-14 Nov. 1991)] 1991 IEEE International Conference on Computer-Aided Design Digest of Technical Papers - DIATEST: a fast diagnostic test pattern generator for combinational circuits

✍ Gruning, T.; Mahlstedt, U.; Koopmeiners, H. 📂 Article 📅 1991 🏛 IEEE Comput. Soc. Press 🌐 English ⚖ 393 KB