[IEEE Comput. Soc. Press 1993 International Conference on Computer Aided Design (ICCAD) - Santa Clara, CA, USA (7-11 Nov. 1993)] Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) - On-chip test generation for combinational circuits by LFSR modification

✍ Scribed by Upadhyaya, S.J.; Chen, L.-C.

• Book ID: 126618721
• Publisher: IEEE Comput. Soc. Press
• Year: 1993
• Weight: 464 KB
• Category: Article
• ISBN-13: 9780818644900
• DOI: 10.1109/ICCAD.1993.580035

✦ Synopsis

A new on-chip test generation technique based on the built-in self test (BIST) and deterministic test generation concepts has been proposed. Given a test set, the test patterns can be regenerated on the chip and applied to the circuit under test without the use of any external test equipments.A systematic procedure for the modijcation of a basic linear feedback shifi register (LFSR) to realize the on-chip test generation hardware is given. Since the delay introduced by the modification of the LFSR is only two gate delays, at-speed testing of circuits is feasible. Experiments are conducted and test application time and hardware overhead are conapared with a known test technique under the same fault coverage conditions.It is shown that both test cost and test application time can be decreased significantly by using the proposed technique.