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[IEEE Comput. Soc. Press 1993 International Conference on Computer Aided Design (ICCAD) - Santa Clara, CA, USA (7-11 Nov. 1993)] Proceedings of 1993 International Conference on Computer Aided Design (ICCAD) - On-chip test generation for combinational circuits by LFSR modification

โœ Scribed by Upadhyaya, S.J.; Chen, L.-C.


Book ID
126618720
Publisher
IEEE Comput. Soc. Press
Year
1993
Weight
464 KB
Category
Article
ISBN-13
9780818644900

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[IEEE Comput. Soc. Press 1993 Internatio
โœ Upadhyaya, S.J.; Chen, L.-C. ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› IEEE Comput. Soc. Press โš– 464 KB

A new on-chip test generation technique based on the built-in self test (BIST) and deterministic test generation concepts has been proposed. Given a test set, the test patterns can be regenerated on the chip and applied to the circuit under test without the use of any external test equipments.A syst