[IEEE Comput. Soc. Press 1993 Internatio
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Upadhyaya, S.J.; Chen, L.-C.
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Article
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1993
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IEEE Comput. Soc. Press
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A new on-chip test generation technique based on the built-in self test (BIST) and deterministic test generation concepts has been proposed. Given a test set, the test patterns can be regenerated on the chip and applied to the circuit under test without the use of any external test equipments.A syst