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Comprehensive investigation of the impact of lateral charge migration on retention performance of planar and 3D SONOS devices

โœ Scribed by A. Maconi; A. Arreghini; C. Monzio Compagnoni; G. Van den bosch; A.S. Spinelli; J. Van Houdt; A.L. Lacaita


Book ID
116890864
Publisher
Elsevier Science
Year
2012
Tongue
English
Weight
909 KB
Volume
74
Category
Article
ISSN
0038-1101

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