Impact of Charge Trapping Layer Thickness and New Trade-Off in Performance Characteristics of 3-D SONOS Devices

✍ Scribed by Arreghini, Antonio; Kar, Gouri Sankar; Van den bosch, Geert; Van Houdt, Jan

• Book ID: 123615549
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 263 KB
• Volume: 34
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/LED.2013.2253442