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Comprehensive analysis of the deposition caused by scattered Ga ions during focused ion-beam-induced deposition

โœ Scribed by Tripathi, S.K.; Shukla, N.; Rajput, N.S.; Singh, A.K.; Kulkarni, V.N.

Book ID
114461452
Publisher
The Institution of Engineering and Technology
Year
2010
Tongue
English
Weight
233 KB
Volume
5
Category
Article
ISSN
1750-0443

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## Abstract Pt/Ga/C and Pt/C composite nanowires have been fabricated using ion beam induced deposition (IBID) and electron beam induced deposition (EBID), respectively, with a dual beam focused ion beam system. The Pt/Ga/C composite nanowires usually exhibit a semiconducting character and their re