Focused ion beam induced deposition: fabrication of three-dimensional microstructures and Young's modulus of the deposited material
β Scribed by Reyntjens, S; Puers, R
- Book ID
- 120823994
- Publisher
- Institute of Physics
- Year
- 2000
- Tongue
- English
- Weight
- 393 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0960-1317
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The chemical composition and microstructure of dual ion beam-deposited Γlms with nitrogen contents in the CN x range 20-33 at.% have been examined by Fourier transform infrared spectroscopy (FTIR) and x-ray photoelectron spectroscopy (XPS). The FTIR spectra together with other published data have be
The chemical bonding and microstructure of dual ion beam-deposited Γlms with nitrogen contents in the CN x range 20-33 at.% have been examined by Fourier transform infrared spectroscopy (FTIR) and x-ray photoelectron spectroscopy (XPS). The FTIR spectra together with other published data have been u