Compositional and optical characterization of rf sputter deposited TeOx thin films for optical disk application

✍ Scribed by Massimo Di Giulio; Roberto Rella; Pietro Siciliano; Stefano Cucurachi

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 458 KB
• Volume: 43
• Category: Article
• ISSN: 0042-207X
• DOI: 10.1016/0042-207x(92)90161-o