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Compositional analysis and depth profiling of thin film CrO2 by heavy ion ERDA and standard RBS: a comparison

✍ Scribed by S. Khamlich; M. Msimanga; C.A. Pineda-Vargas; Z.Y. Nuru; R. McCrindle; M. Maaza

Book ID: 113780535
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 748 KB
Volume: 70
Category: Article
ISSN: 1044-5803
DOI: 10.1016/j.matchar.2012.05.003

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