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Complex determination of semiconductor layer parameters by fourier spectrometry methods

โœ Scribed by A. A. Kopylov; V. V. Lezhnev

Book ID
104980405
Publisher
Springer US
Year
1987
Tongue
English
Weight
255 KB
Volume
30
Category
Article
ISSN
0543-1972

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Optical methods and their limitations are described that allow one to obtain the physical parameters of semiconductor nanocrystals (quantum dots) embedded in a glass matrix. The parameters determined are: average radius, confinement energy, band gap, number of atoms in an average-radius nanocrystal,