Methods for determination of conductivity and dielectric relaxation parameters of heterogeneous semiconductor materials using isolation layers

✍ Scribed by V. V. Sagoskin; E. A. Zamotrinskaya; T. G. Mikhailova; V. M. Nesterov; V. I. Solov'ev

• Book ID: 112426006
• Publisher: Springer
• Year: 1983
• Tongue: English
• Weight: 415 KB
• Volume: 26
• Category: Article
• ISSN: 1573-9228
• DOI: 10.1007/bf00891920