A novel method for determination of dielectric properties of materials using a combined embedded modulated scattering and near-field microwave techniques-Part II: dielectric property recalculation

✍ Scribed by Hughes, D.; Zoughi, R.

• Book ID: 114630027
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 183 KB
• Volume: 54
• Category: Article
• ISSN: 0018-9456
• DOI: 10.1109/tim.2005.858133