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Compatible real-time rates of mineral dissolution by Atomic Force Microscopy (AFM)

โœ Scribed by Patricia M. Dove; Forest M. Platt


Book ID
115815691
Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
954 KB
Volume
127
Category
Article
ISSN
0009-2541

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Time-of-ร‘ight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM) were utilized to characterize polypropylenes of di โ€ erent stereoregularity (atactic, syndiotactic and isotactic) deposited on gold-or silver-coated mica surfaces. The AFM images clearly revealed distinctive su