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Comparison of low- and room-temperature damage formation in Ar ion implanted GaN and ZnO

✍ Scribed by Wendler, E.; Wesch, W.; Azarov, A.Yu.; Catarino, N.; Redondo-Cubero, A.; Alves, E.; Lorenz, K.

Book ID: 125427785
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 555 KB
Volume: 307
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2013.01.020

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