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Comparison of ion beam and electron beam induced transport of hot charge carriers in metal-insulator-metal junctions

✍ Scribed by Hopster, Johannes; Diesing, Detlef; Wucher, Andreas; Schleberger, Marika

Book ID: 121292812
Publisher: Cambridge University Press
Year: 2011
Weight: 230 KB
Volume: 1354
Category: Article
ISSN: 0272-9172
DOI: 10.1557/opl.2011.1083

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