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Recent results in ion beam induced charge microscopy: Unconnected junction contrast and an assessment of single contact IBIC

✍ Scribed by T. Osipowicz; J.L. Sanchez; I. Orlić; F. Watt; S. Kolachina; V.K.S. Ong; D.S.H. Chan; J.C.H. Phang


Book ID
114169293
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
481 KB
Volume
130
Category
Article
ISSN
0168-583X

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