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Comparing different approaches to characterization of focused X-ray laser beams

✍ Scribed by J. Chalupsky; P. Bohacek; V. Hajkova; S.P. Hau-Riege; P.A. Heimann; L. Juha; J. Krzywinski; M. Messerschmidt; S.P. Moeller; B. Nagler; M. Rowen; W.F. Schlotter; M.L. Swiggers; J.J. Turner

Publisher
Elsevier Science
Year
2011
Tongue
English
Weight
333 KB
Volume
631
Category
Article
ISSN
0168-9002

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