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Comparative studies of ion-implanted crystals subjected to pulsed-laser and thermal annealings by means of X-ray and electron-optical methods

✍ Scribed by Auleytner, J.

Publisher: John Wiley and Sons
Year: 1995
Tongue: English
Weight: 575 KB
Volume: 150
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211500117

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