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Compact Test Pattern Selection for Small Delay Defect

โœ Scribed by Chia-Yuan Chang, ; Kuan-Yu Liao, ; Sheng-Chang Hsu, ; Li, J. C.; Jiann-Chyi Rau,


Book ID
120826259
Publisher
IEEE
Year
2013
Tongue
English
Weight
302 KB
Volume
32
Category
Article
ISSN
0278-0070

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