✦ LIBER ✦
Test-Pattern Selection for Screening Small-Delay Defects in Very-Deep Submicrometer Integrated Circuits
✍ Scribed by Yilmaz, M.; Chakrabarty, K.; Tehranipoor, M.
- Book ID
- 117908418
- Publisher
- IEEE
- Year
- 2010
- Tongue
- English
- Weight
- 1007 KB
- Volume
- 29
- Category
- Article
- ISSN
- 0278-0070
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