Test compaction for small-delay defects using an effective path selection scheme

✍ Scribed by Xiang, Dong; Li, Jianbo; Chakrabarty, Krishnendu; Lin, Xijiang

• Book ID: 120647520
• Publisher: Association for Computing Machinery
• Year: 2013
• Tongue: English
• Weight: 378 KB
• Volume: 18
• Category: Article
• ISSN: 1084-4309
• DOI: 10.1145/2491477.2491488