Comments, with reply, on "Reliability of modified designs-a Bayes analysis of an accelerated test of electronic assemblies" by L. Hart

✍ Scribed by Ganter, W.A.

• Book ID: 114555654
• Publisher: IEEE
• Year: 1990
• Tongue: English
• Weight: 351 KB
• Volume: 39
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/24.61307