Comment on: reliability of modified designs—a Bayes analysis of an accelerated test of electronic assemblies : William A. Ganter. IEEE Trans. Reliab.39(5), 520 (1990)

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 120 KB
• Volume: 31
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(91)90120-v