Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies : Louis Hart. IEEE Trans. Reliab.39(2), 140 (1990)

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 135 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90143-9