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Comments on "A New Microwave Method of Measuring Complex Dielectric Constant of High-Permittivity Thin Films"

Book ID: 114628413
Publisher: IEEE
Year: 1975
Tongue: English
Weight: 169 KB
Volume: 24
Category: Article
ISSN: 0018-9456
DOI: 10.1109/tim.1975.4314432

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