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Comment on “Channel Length and Threshold Voltage Dependence of a Transistor Mismatch in a 32-nm HKMG Technology”

✍ Scribed by Hook, T.B.; Johnson, J.B.; Cathignol, A.; Cros, A.; Ghibaudo, G.

Book ID: 114620368
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 217 KB
Volume: 58
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2011.2104962

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continued from page 75 precious metal-based materials. These differences are primarily related to the ease of oxidation of the solder alloy powders. The relationship between solder flux chemistry and the reactivity of solder powders is described in terms of functional performance. Production and Pr