Channel Length and Threshold Voltage Dependence of Transistor Mismatch in a 32-nm HKMG Technology

✍ Scribed by Hook, T.B.; Johnson, J.B.; Jin-Ping Han; Pond, A.; Shimizu, T.; Tsutsui, G.

• Book ID: 114620111
• Publisher: IEEE
• Year: 2010
• Tongue: English
• Weight: 324 KB
• Volume: 57
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2010.2057193