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Combined scanning (EBIC) and transmission electron microscopic investigations of dislocations in semiconductors

✍ Scribed by Blumtritt, H. ;Gleichmann, R. ;Heydenreich, J. ;Johansen, H.

Publisher: John Wiley and Sons
Year: 1979
Tongue: English
Weight: 796 KB
Volume: 55
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210550231

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