High resolution electron microscopic investigations of dislocations in deformed GaAs single crystals doped with Te

✍ Scribed by Maksimov, S. K. ;Ziegler, M. ;Khodos, I. I. ;Snighiryova, I. I. ;Shikhsaidov, M. Sh.

• Publisher: John Wiley and Sons
• Year: 1984
• Tongue: English
• Weight: 612 KB
• Volume: 84
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/pssa.2210840110