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Combined RBS and TEM characterization of nano-SiGe layers embedded in SiO2

✍ Scribed by A. Kling; M.I. Ortiz; J. Sangrador; A. Rodríguez; T. Rodríguez; C. Ballesteros; J.C. Soares

No coin nor oath required. For personal study only.

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Combined grazing incidence RBS and TEM a

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Fast and intense photoluminescence in a

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Characterisation of Ge nanocrystals in c

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