Characterisation of Ge nanocrystals in co-sputtered Ge+SiO2 system using raman spectroscopy, RBS and TEM

✍ Scribed by Y.W Ho; V Ng; W.K Choi; S.P Ng; T Osipowicz; H.L Seng; W.W Tjui; K Li

• Book ID: 114386397
• Publisher: Elsevier Science
• Year: 2001
• Tongue: English
• Weight: 239 KB
• Volume: 44
• Category: Article
• ISSN: 1359-6462
• DOI: 10.1016/s1359-6462(01)00743-6