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Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons

✍ Scribed by Kislovskii, E. N.; Molodkin, V. B.; Olikhovskii, S. I.; Len, E. G.; Sheludchenko, B. V.; Lizunova, S. V.; Vladimirova, T. P.; Kochelab, E. V.; Reshetnyk, O. V.; Dovganyuk, V. V.; Fodchuk, I. M.; Lytvynchuk, T. V.; Kladâko, V. P.

Book ID: 120455069
Publisher: Pleiades Publishing
Year: 2013
Tongue: English
Weight: 584 KB
Volume: 7
Category: Article
ISSN: 1027-4510
DOI: 10.1134/S1027451013030270

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