✦ LIBER ✦

Combinatorial design approaches for automatic test generation

✍ Scribed by Liang Shi; Baowen Xu; Changhai Nie

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

An algorithm for fault diagnosis based o

✍ Changhai Nie; Baowen Xu; Liang Shi 📂 Article 📅 2003 🏛 SP Science Press 🌐 English ⚖ 217 KB

Logic Design Validation via Simulation a

✍ Hussain Al-asaad; John P. Hayes 📂 Article 📅 2000 🏛 Springer US 🌐 English ⚖ 224 KB

Test generation for sequential circuits

✍ Tetsu Hasegawa; Kyoko Miura; Toshiaki Ohmameuda; Hideo Ito 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 255 KB

Iterative automatic test generation meth

✍ G. Kovács; Z. Pap; G. Csopaki; K. Tarnay 📂 Article 📅 2006 🏛 Elsevier Science 🌐 English ⚖ 282 KB

Automatic Test Pattern Generation for Re

✍ Piet Engelke; Ilia Polian; Michel Renovell; Bernd Becker 📂 Article 📅 2006 🏛 Springer US 🌐 English ⚖ 509 KB

Automatic Test Generation System for EFS

✍ Ting Shu; Qiangxin Cai; Lianggui Liu; Yubo Jia 📂 Article 📅 2012 🏛 Elsevier 🌐 English ⚖ 297 KB