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CMOS/SOS RAM transient radiation upset and "inversion" effect investigation

✍ Scribed by Nikiforov, A.Y.; Poljakov, I.V.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Test CMOS/SOS RAM for transient radiatio

✍ Nikiforov, A.Y.; Poljakov, I.V. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 670 KB

Dominant mechanisms of transient-radiati

✍ A. V. Kirgizova; A. Y. Nikiforov; N. G. Grigor’ev; I. V. Poljakov; P. K. Skorobo 📂 Article 📅 2006 🏛 Springer 🌐 English ⚖ 234 KB

Investigation of Radiation Effects and H

✍ Peel, J. L.; Pancholy, R. K.; Kuhlmann, G. J.; Oki, T. J.; Williams, R. A. 📂 Article 📅 1975 🏛 IEEE 🌐 English ⚖ 933 KB

[IEEE International Conference on Microe

✍ Nikiforov, A.Y.; Chumakov, V.I.; Skorobogatov, O. 📂 Article 📅 1996 🏛 IEEE ⚖ 694 KB