✦ LIBER ✦
Dominant mechanisms of transient-radiation upset in CMOS RAM VLSI circuits realized in SOS technology
✍ Scribed by A. V. Kirgizova; A. Y. Nikiforov; N. G. Grigor’ev; I. V. Poljakov; P. K. Skorobogatov
- Book ID
- 110214249
- Publisher
- Springer
- Year
- 2006
- Tongue
- English
- Weight
- 234 KB
- Volume
- 35
- Category
- Article
- ISSN
- 1063-7397
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