Direct detection in Transmission Electro
โ
Devis Contarato; Peter Denes; Dionisio Doering; John Joseph; Brad Krieger
๐
Article
๐
2011
๐
Elsevier Science
๐
English
โ 355 KB
This paper presents the characterization of a CMOS monolithic pixel sensor prototype optimized for direct detection in Transmission Electron Microscopy (TEM). The sensor was manufactured in a deepsubmicron commercial CMOS process and features pixels of 5 mm pitch. Different pixel architectures have